Dongguan Lixian Instrument Scientific Co.,LTD
Dongguan Lixian Instrument Scientific Co.,LTD have 22 years of experience in design, research and development. Factory covers an area of 6000 square meters, Total number of employees more than 60 in
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Temperature And Humidity Test Chamber Equipment summary:The machine is applied to test the materials in heat-resistance, cold-resistance, dry-resistance, moisture-resistance. It is simple to operate and program easy to edit. It can show the set values and operative time.
Temperature And Humidity Test Chamber technical parameter
| Model | (HZ-2004A)80-1000 |
| Temperature range | -70 degree ~ +100(150) degree |
| Humidity range | 20%~98%R.H. |
| Accuracy/ uniformly | ±0.1 degree ±0.1%R.H./ ±1.0 degree ±3.0%R.H. |
| Accuracy / volatility | ±1.0 degree ±2.0%R.H. / ±0.5 degree ±2.0%R.H. |
| Heating / cooling time | About 4.0/min(heat),about 1.0/min(cool) ( 5~10/mm is the specific condition ) |
| Inside material | Stainless steel SUS 304 # |
| Insulation material | High-temperature high-density amino acid ethyl ester foam insulation materials, |
| Cooling system | Air-cooled/ single-stage compressor(-20 degree) , wind, water cooled/two-stage compressor(-40~-70 degree) |
| Protection | compressor overload switch, high and low pressure protection switch, over-humidity-temperature protection switches, fuses, warning system |
| Accessories | recorder(purchase), view window, 50mm testing hole, PL lamp, clapboard, Dry and wet gauze ball |
Temperature And Humidity Test Chamber Applicable industries:
Applied to control the product quality, such as electronic, plastic products, electrical appliances, instruments, food, vehicles, metals, chemicals, building materials, aerospace, medical care and so on.
Temperature And Humidity Test Chamber Corresponding standard:
1. International Electrotechnical Commission Standard:
IEC68-2-03_test method Ca_Steady damp-heat
IEC68-2-01_test method A_cold
IEC68-2-02_test method B_dry heat
2. Military Standards:
3. Japanese Industrial Standard:
JIS C60068-2-3-1987 test method Ca: Steady damp-heat
JIS C60068-2-2-1995 test method B:dry heat
JIS C60068-2-1-1995 test method A:low temperature
4. USA Semiconductor Industry Standard:
JESD22-A101-B-2004 Constant temperature and humidity test
JESD22-A103-C-2004 High Temperature Storage Test
JESD22-A119-2004 Low Temperature Storage Test